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CHEM544 - Characterization Methods in Nanoscience

Introduction to techniques in determining the composition and structure of materials on the nanometer scale. Characterization of atomic, meso-, and micro-structure of materials including impurities and defects. Major topics will include electron microscopy (transmission, scanning, and Auger) and associated spectroscopies (EDX, EELS), surface sensitive spectroscopies (e.g., XPS, AES, IR) and spectrometry (SIMS), synchrotron techniques, X-ray absorption, fluorescence and emission, and scanned probe microscopies (AFM, STM, etc.). The techniques will be examined through real-world nanotechnology case studies. Not open to students with credit in CHEM 444.

Fall Term 2017

Lecture Sections

Fall Term 2017 - LEC A1 (75645)

TR 12:30:00 - 13:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile
Fall Term 2016

Lecture Sections

Fall Term 2016 - LEC A1 (65991)

TR 12:30:00 - 13:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile
Fall Term 2011

Lecture Sections

Fall Term 2011 - LEC A1 (47494)

TR 12:30:00 - 13:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile
Fall Term 2009

Lecture Sections

Fall Term 2009 - LEC A1 (38602)

MWF 13:00:00 - 13:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile