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CHEM444 - Characterization Methods in Nanoscience

Introduction to techniques in determining the composition and structure of materials on the nanometer scale. Characterization of atomic, meso-, and microstructure of materials including impurities and defects. Major topics will include electron microscopy (transmission, scanning, and Auger) and associated spectroscopies (EDX, EELS), surface sensitive spectroscopies (e.g., XPS, AES, IR) and spectrometry (SIMS), synchrotron techniques, X-ray absorption, fluorescence and emission, and scanned probe microscopies (AFM, STM, etc.). The strengths, weaknesses, and complementarity of the techniques used will be examined via case studies on the characterization of real-world nanotechnologies, such as heterogeneous catalysts, surfaces and interfaces in semiconductor devices, organic monolayers on metals and semiconductors, nanotube- and nanowire-based electronics, and biocompatible materials. Prerequisite: 4th year standing or consent of instructor.

Fall Term 2017

Lecture Sections

Fall Term 2017 - LEC A1 (75644)

TR 12:30:00 - 13:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile
Fall Term 2016

Lecture Sections

Fall Term 2016 - LEC A1 (65989)

TR 12:30:00 - 13:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile
Fall Term 2011

Lecture Sections

Fall Term 2011 - LEC A1 (47493)

TR 12:30:00 - 13:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile
Fall Term 2009

Lecture Sections

Fall Term 2009 - LEC A1 (38601)

MWF 13:00:00 - 13:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile
Fall Term 2007

Lecture Sections

Fall Term 2007 - LEC A1 (98126)

MWF 12:00:00 - 12:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile
Winter Term 2007

Lecture Sections

Winter Term 2007 - LEC B1 (46906)

MWF 12:00:00 - 12:50:00 (C E5 36)
Instructor: jveinot@ualberta.ca - Profile